The UK electronics test and debug event for boards and systems..

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ATE Switching - what are your options?

The majority of Automatic Test Equipment requires switching to increase flexibility when connecting nstrumentation to the device under test (DUT). DUTs have a huge range of voltage, current and frequency specifications. This presentation will give an overview of different switch types, that are available in different configurations to optimise test system cost and size. The range of architectures will be discussed, with special emphasis on PXI.

(Nick Hickford - Pickering Interfaces)

 

 

Low cost JTAG Tools for Hardware Validation

Traditional JTAG/Boundary-scan tools used in production testing use sophisticated automatic program generators that can be costly. Low-cost, yet still powerful, tools now exist to serve the design community and those with a small-scale production need. See how JTAG can help you with your next board ‘bring-up’

(James Stanbridge - JTAG Technologies)

 

 

Eliminating cables from modular ATE platforms

Modern test systems are typically built using high performance PXI modular instrumentation. PXI offers outstanding performance combined with very high density I/O. Choosing the best electrical interconnection to the system is critical to ensuring the user maximises the performance potential of their system. We explore different connections options available for PXI based test systems to ensure the best performance, value and scalability. (Gary Clayton - MAC Panel)

 

 

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