The UK electronics test and debug event for boards and systems..
ATE Switching - what are your options?
The majority of Automatic Test Equipment requires switching to increase flexibility
when connecting nstrumentation to the device under test (DUT). DUTs have a huge range
of voltage, current and frequency specifications. This presentation will give an
overview of different switch types, that are available in different configurations
to optimise test system cost and size. The range of architectures will be discussed,
with special emphasis on PXI.
(Nick Hickford - Pickering Interfaces)
Low cost JTAG Tools for Hardware Validation
Traditional JTAG/Boundary-scan tools used in production testing use sophisticated
automatic program generators that can be costly. Low-cost, yet still powerful, tools
now exist to serve the design community and those with a small-scale production need.
See how JTAG can help you with your next board ‘bring-up’
(James Stanbridge - JTAG Technologies)
Eliminating cables from modular ATE platforms
Modern test systems are typically built using high performance PXI modular instrumentation.
PXI offers outstanding performance combined with very high density I/O. Choosing
the best electrical interconnection to the system is critical to ensuring the user
maximises the performance potential of their system. We explore different connections
options available for PXI based test systems to ensure the best performance, value
and scalability. (Gary Clayton - MAC Panel)